Display light-on test device and method

ABSTRACT

In an embodiment, the display light-on test device includes: a plurality of D-type connectors configured to be correspondingly connected to mobile phones with different connector types, and receive and transmit power signals; a sampling processor configured to receive the power signals, sample and quantize the power signals into digital data and/or image data, and output the data to a field programmable gate array chip, receive commands, and output, according to the commands, corresponding micro control commands; the field programmable gate array chip connected to the D-type connectors and the sampling processor, and configured to receive the data and the micro control commands, generate corresponding micro control parameters, and process, according to the micro control parameters, the data, to output data required to perform the light-on tests to the display modules to be tested, so that the light-on tests are performed on the display modules to be tested.

FIELD OF INVENTION

The present disclosure relates to a technical field of displays, andmore particularly to a display light-on test device and a displaylight-on test method.

BACKGROUND OF INVENTION

Since the release of IPhone X, full screen displays of OLED displaytechnologies have been widely accepted by consumers, and the marketreaction has been dramatic. In the foreseeable future, flexible displaysapplied with PI substrates must be extremely competitive displaytechnologies. Regardless of whether they are full screen displays orflexible displays, their common technology bases are to combine anddispose DICs, TICs, Force Touchs, S-Pens, etc., on flexible circuitboards, and then wrap around panels until to backs of the panels. Then,flexible circuit boards are connected to mainboards of applicationprocessors of electronic devices such as mobile phones and pads throughconnectors having a plurality of pins. In addition to these differentkinds of ICs, under different requirements of different manufacturers,even same kinds of ICs need to have configured connectors differ greatlyin specifications such as length, width, number of pins, spacing ofpins, etc. In this manner, when optical, electrical, power consumption,timing, issue analysis operations, etc., are performed on panels, acorresponding connector is needed for each of connectors of differenttypes, and even a corresponding connecting test jig is needed formatching. This not only results in waste of material costs, but alsoneed replacement corresponding to test requirements, causing waste oflabor and time.

In the related art, for testing power consumption, timing, and processorinterface signals of, for example, a DIC, a TIC, and a display of amobile phone, an application processor of a mainboard of the mobilephone usually needs to be designed separately from a panel. By making aspecial transfer jig (e.g. disposing an FPC flexible circuit board), andreserving probes in the middle, a test function is realized. However,because connector types of different kinds of mobile phones differgreatly, if a corresponding test jig is made for each type of connector,for manufacturers, costs are bond to increase significantly.

SUMMARY OF INVENTION

An object of the present disclosure is to provide a display light-ontest device and a display light-on test method, to solve the problemthat a corresponding light-on test jig is required for each differentkind and each different type.

Another object of the present disclosure is to provide a displaylight-on test device and a display light-on test method that simplify adesign of a hardware portion of the display light-on test device underthe premise that the original display light-on test technique is notsignificantly changed to adapt specially to different kinds of connectortypes, and perform a light-on test with only an integrated connectorreplaced for a different type of mobile phone, to save costs.

Still another objective of the present disclosure is to provide adisplay light-on test device and a display light-on test method thatrealize more complicated functions, such as automatically testingvoltage, current, power consumption, and a processor interface decodingprocess, etc., using a field programmable gate array chip, and sending aresulting information of testing to a display for display.

In order to solve the aforementioned problem, the solution provided bythe present disclosure is: providing a display light-on test device,wherein the device is configured to perform operation of light-on testson a plurality of display modules to be tested simultaneously. Thedevice includes: a plurality of D-type connectors configured to becorrespondingly connected to matching display modules to be tested amongmobile phones with different connector types, and receive and transmitprocessor interface power signal data, positive voltage power signaldata, negative voltage power signal data, or TIC power signal data; asampling processor configured to sample and quantize received DIC powersignal data, TIC power signal data, positive voltage power signal data,or negative voltage power signal data into required digital signal dataand/or image signal data, and output the digital signal data and/orimage signal data to a field programmable gate array chip, and output,according to commands received by the sampling processor, correspondingmicro control commands; the field programmable gate array chip connectedto the D-type connectors and the sampling processor to receive thesignal data and generate, according to the micro control commands,corresponding micro control parameters, and process the signal dataaccording to the micro control parameters, to output signal datarequired to perform the light-on tests to the display modules to betested, so that the light-on tests are performed on the display modulesto be tested.

The display light-on test device further includes: an integratedconnector, wherein the integrated connector is configured with a row oftest lead plugs (male) and a row of test lead sockets (female)correspondingly on a left side and a right side of the integratedconnector, and each test lead plug and each test lead socket are bothconnected to a matching voltage switch, current switch, and standardcurrent switch. That is, each test lead plug on the left side isinstalled with the corresponding voltage switch, current switch, andstandard current switch. Each test lead socket on the right side isinstalled with a corresponding inline voltage meter, inline currentmeter, and current regulator. Therefore, a display panel on the leftside is connected to an application processor of a mobile phone on theright side, to form a display module to be tested.

Through the D-type connectors correspondingly connected to the matchingdisplay modules to be tested among the mobile phones with the differentconnector types, one-time inspections are performed, and the operationof the light-on tests is simultaneously performed.

With respect to a different type of mobile phone, only the integratedconnector needs to be replaced for the display light-on test device tobe adapted to the different type of mobile phone, and then a light-ontest may be performed.

The field programmable gate array chip has a microprocessor, a displaycontroller, and a storage controller storing computing programsintegrated therein. The microprocessor is configured to outputinitialization information, and is connected to the display controller.The storage controller is connected to a D-type connector and thesampling processor, and configured to receive and store the digitalsignal data and/or image signal data and the micro control commands, andread the digital signal data and/or image signal data stored internally,and suitably provide read digital signal data and/or image signal datato the microprocessor. The field programmable gate array chip isconnected to the D-type connector, which is connected to the displaymodule to be tested, through the display controller, to output theinitialization information to the display module to be tested for aninitialization operation to be performed on the display module to betested, and output processed digital data and/or image data required toperform a light-on test on the display module to be tested to thedisplay module to be tested, so that the light-on test is performed onthe display module to be tested.

Based on an aforementioned structure of the embodiment, the displaylight-on test device of the present disclosure performs one-timeinspections on the display modules to be tested, and performs operationof the light-on tests simultaneously on the display modules to be testedthrough the following. The D-type connectors are correspondinglyconnected to the matching display modules to be tested among the mobilephones with the different connector types. The field programmable gatearray chip is connected to the D-type connectors, which arecorrespondingly connected to the display modules to be tested, throughthe display controller, to output initialization information to thedisplay modules to be tested for initialization operations to beperformed on the display modules to be tested, and output processeddigital data and/or image data required to perform the light-on tests onthe display modules to be tested to the display modules to be tested, sothat one-time inspections are performed on the display modules to betested, and the operation of the light-on tests is simultaneouslyperformed on the display modules to be tested.

The field programmable gate array chip further includes: a parameterconfigurator configured to receive micro control commands output fromthe storage controller, generate, according to the micro controlcommands, the corresponding micro control parameters, automaticallyprocess, according to the micro control parameters, the required digitaldata and/or image data from sampling the signal data, to generate theinitialization information, which is then provided to themicroprocessor. By connecting the microprocessor to the displaycontroller, and the display controller to the display module to betested, the initialization information is output to the display moduleto be tested for the initialization operation to be performed on thedisplay module to be tested, and a final result is fed back to a displayfor display.

The field programmable gate array chip further includes: a digital/imageprocessor connected to the storage controller, to receive digital dataand/or image data output by the storage controller, wherein thedigital/image processor is further connected to the parameterconfigurator, to process, according to the micro control parameters, thedigital data and/or image data; and a selection controller connected tothe digital/image processor, and configured to select, according to aselected type mode, one of digital data and/or image data output by thedigital/image processor, and output processed digital data and/or imagedata to serve as the digital data and/or image data required to performthe light-on test on the display module to be tested, wherein theselection controller is further connected to the display controllerwhich is connected to the D-type connector, so that the processeddigital data and/or image data selected by the digital/image processoris provided to a corresponding display module to be tested.

The selection controller is further connected to the microprocessor, toreceive a type mode selecting command output by the microprocessor, andoperate, according to a mobile phone type selecting command, under acorresponding selected matching type mode.

The display light-on test device further includes: a power micro controlmodule connected between the field programmable gate array chip and eachof the D-type connectors, to receive power control parameters output bythe field programmable gate array chip, and output, through each of theD-type connectors, a corresponding power voltage to each of the displaymodules to be tested according to the power control parameters, tocontrol the light-on tests to be performed on the display modules to betested at different power.

The field programmable gate array chip further includes: a powermicrocontroller connected to the parameter configurator and the powermicro control module, wherein the control parameters generated by theparameter configurator include the power control parameters. The powermicrocontroller receives the power control parameters, generates,according to the power control parameters, corresponding power controlcommands, and outputs the corresponding power control commands to thepower micro control module, which controls the corresponding powervoltage to be output.

The sampling processor further includes: a digital-to-analog converterconfigured to sample and quantize voltage and current signals, and powerconsumption received by the sampling processor into required digitalsignals, and output the digital signals to the field programmable gatearray chip, so that the field programmable gate array chip performs thelight-on tests, thereby realizing automatic test operation.

When an initial code of a DIC processor interface of a display panel isgiven through the storage controller integrated in the fieldprogrammable gate array chip, the display panel is lightened directlythrough the field programmable gate array chip, without providing powerto the display panel by the application processor, but providing powerto the display panel by the field programmable gate array chip; or whenan initial code of a DIC processor interface of a display panel is notgiven, an image is first compressed into a standard VESC imagereceivable by a DIC, and then the display panel is lightened through theapplication processor, a switch of the processor interface is thenturned off, and the compressed image is sent through the fieldprogrammable gate array chip, and a final result is fed back to adisplay for display. The field programmable gate array chip can furtherbe combined with an optical algorithm, to analyze optical issues.

In order to solve the aforementioned problem, another solution providedby the present disclosure is: providing a display light-on test methodthat uses any of the above display light-on test devices. The methodincludes: connecting a display panel to an application processor of amobile phone through an integrated connector, to form a display moduleto be tested, wherein the integrated connector is configured with a testlead plug (male) and a test lead socket (female) correspondingly on aleft side and a right side of the integrated connector; and the testlead plug and the test lead socket are both connected to a matchingvoltage switch, current switch, and standard current switch; receivingand transmitting power signals through a plurality of D-type connectorscorrespondingly connected to display modules to be tested among mobilephones with different connector types; receiving the power signals,sampling and quantizing the power signals into required digital dataand/or image data, and outputting the digital data and/or image data toa field programmable gate array chip through a sampling processor;outputting initialization information through a microprocessorintegrated in the field programmable gate array chip; outputtinginitialization information through a microprocessor integrated in thefield programmable gate array chip; outputting the initializationinformation through a display controller integrated in the fieldprogrammable gate array chip; transmitting the initializationinformation through the D-type connectors to the display modules to betested; and performing initialization operations on the display modulesto be tested; reading stored digital data and/or image data required toperform light-on tests through a storage controller integrated in thefield programmable gate array chip; receiving micro control commandssent by the sampling processor, generating, according to the microcontrol commands, corresponding micro control parameters, andprocessing, according to the micro control parameters, required digitaldata and/or image data through the field programmable gate array chip;and outputting processed digital data and/or image data required toperform light-on tests on the display modules to be tested to thedisplay modules to be tested through the display controller integratedin the field programmable gate array chip and connected to the D-typeconnectors, so that one-time inspections are performed on the displaymodules to be tested and operation of the light-on tests issimultaneously performed on the display modules to be tested.

In order to solve the aforementioned problem, another solution providedby the present disclosure is: providing a display light-on test device,wherein the device is configured to perform operation of light-on testson a plurality of display modules to be tested simultaneously. Thedevice includes:

-   -   a plurality of integrated connectors, wherein each of the        integrated connectors is configured with a corresponding test        lead plug and a corresponding test lead socket on both sides of        each of the integrated connectors; and the corresponding test        lead plug and the corresponding test lead socket are both        connected to a matching voltage switch, current switch, and        standard current switch, so that the integrated connectors        connect display panels of a corresponding plurality of mobile        phones with different connector types to application processors        thereof, to form the display modules to be tested;    -   a plurality of D-type connectors correspondingly connected to        the display modules to be tested, and configured to receive and        transmit power signals;    -   a sampling processor configured to receive the power signals,        sample and quantize the power signals into required digital data        and/or image data, and output the digital data and/or image data        to a field programmable gate array chip, receive commands, and        output, according to the commands, corresponding micro control        commands; and    -   the field programmable gate array chip having a microprocessor,        a display controller, and a storage controller integrated        therein, wherein the microprocessor is configured to output        initialization information, and is connected to the display        controller; the field programmable gate array chip outputs,        through the display controller, the initialization information        which is transmitted to the display modules to be tested through        the D-type connectors, for initialization operations to be        performed; the storage controller is connected to the D-type        connectors and the sampling processor, and configured to receive        the digital data and/or image data and the micro control        commands; the field programmable gate array chip generates,        according to the micro control commands, corresponding micro        control parameters, and processes, according to the micro        control parameters, the digital data and/or image data, to        output digital data and/or image data required to perform the        light-on tests on the display modules to be tested to the        display modules to be tested, so that operation of the light-on        tests is performed on the display modules to be tested        simultaneously.

In accordance with an embodiment of the present disclosure, adigital-to-analog converter configured to sample and quantize voltageand current signals, and power consumption received by the samplingprocessor into required digital signals, and output the digital signalsto the field programmable gate array chip, so that the fieldprogrammable gate array chip performs the light-on tests.

In accordance with an embodiment of the present disclosure, the samplingprocessor is further connected to a mobile phone/user command receivingmodule configured to receive mobile phone/user commands input by mobilephones/users, and output the mobile phone/user commands to the samplingprocessor.

In accordance with an embodiment of the present disclosure, the fieldprogrammable gate array chip further includes:

-   -   a parameter configurator connected to the storage controller,        and configured to generate, according to the micro control        commands, the corresponding micro control parameters;    -   a digital/image processor connected to the storage controller        and the parameter configurator, and configured to receive        digital data and/or image data output by the storage controller,        and receive micro control parameters sent by the parameter        configurator, and process, according to the micro control        parameters, the digital data and/or image data; and    -   a selection controller connected to the digital/image processor,        and configured to operate under corresponding modes according to        type mode selecting commands, perform selection processing on        processed digital data and/or image data output by the        digital/image processor, and output processed digital data        and/or image data required to perform light-on tests on the        display modules to be tested; and the selection controller is        further connected to the display controller, so that selection        processed digital data and/or image data is output through the        display controller and transmitted through the D-type connectors        to the corresponding display modules to be tested.

In accordance with an embodiment of the present disclosure, theselection controller is further connected to the microprocessor, and isfurther configured to receive type mode selecting commands output by themicroprocessor, to operate, according to the type mode selectingcommands, under corresponding modes.

In accordance with an embodiment of the present disclosure, the displaylight-on test device further includes: a power micro control moduleconnected between the field programmable gate array chip and each of theD-type connectors, and configured to receive power control parametersoutput by the field programmable gate array chip, and output, througheach of the D-type connectors, a corresponding power voltage to each ofthe display modules to be tested according to the power controlparameters, to control the light-on tests to be performed on the displaymodules to be tested at different power.

In accordance with an embodiment of the present disclosure, the fieldprogrammable gate array chip further includes: a power microcontrollerconnected to the parameter configurator and the power micro controlmodule, wherein the control parameters generated by the parameterconfigurator include the power control parameters; the powermicrocontroller is configured to receive the power control parameters,generate, according to the power control parameters, corresponding powercontrol commands, and output the corresponding power control commands tothe power micro control module, which controls the corresponding powervoltage to be output.

In order to solve the aforementioned problem, another solution providedby the present disclosure is: providing a display light-on test device,wherein the device is configured to perform operation of light-on testson a plurality of display modules to be tested simultaneously. Thedevice includes:

-   -   an integrated connector, wherein the integrated connector is        configured with a test lead plug and a test lead socket on both        sides of the integrated connector; and the test lead plug and        the test lead socket are both connected to a matching voltage        switch, current switch, and standard current switch, so that the        integrated connector connects a display panel to an application        processor, to form a display module to be tested;    -   a plurality of D-type connectors correspondingly connected to        the display modules to be tested, and configured to receive and        transmit power signals;    -   a sampling processor configured to receive the power signals,        sample and quantize the power signals into required digital data        and/or image data, and output the digital data and/or image data        to a field programmable gate array chip, receive commands, and        output, according to the commands, corresponding micro control        commands; and    -   the field programmable gate array chip having a microprocessor,        a display controller, and a storage controller integrated        therein, wherein the microprocessor is configured to output        initialization information, and is connected to the display        controller; the field programmable gate array chip outputs,        through the display controller, the initialization information        which is transmitted to the display modules to be tested through        the D-type connectors, for initialization operations to be        performed; the storage controller is connected to the D-type        connectors and the sampling processor, and configured to receive        the digital data and/or image data and the micro control        commands; the field programmable gate array chip generates,        according to the micro control commands, corresponding micro        control parameters, and processes, according to the micro        control parameters, the digital data and/or image data, to        output digital data and/or image data required to perform the        light-on tests on the display modules to be tested to the        display modules to be tested, so that operation of the light-on        tests is performed on the display modules to be tested        simultaneously.

In accordance with an embodiment of the present disclosure, adigital-to-analog converter configured to sample and quantize voltageand current signals, and power consumption received by the samplingprocessor into required digital signals, and output the digital signalsto the field programmable gate array chip, so that the fieldprogrammable gate array chip performs the light-on tests.

In accordance with an embodiment of the present disclosure, the samplingprocessor is further connected to a mobile phone/user command receivingmodule configured to receive mobile phone/user commands input by mobilephones/users, and output the mobile phone/user commands to the samplingprocessor.

In accordance with an embodiment of the present disclosure, the fieldprogrammable gate array chip further includes:

-   -   a parameter configurator connected to the storage controller,        and configured to generate, according to the micro control        commands, the corresponding micro control parameters; and    -   a digital/image processor connected to the storage controller        and the parameter configurator, and configured to receive        digital data and/or image data output by the storage controller,        and receive micro control parameters sent by the parameter        configurator, and process, according to the micro control        parameters, the digital data and/or image data; and    -   a selection controller connected to the digital/image processor,        and configured to operate under corresponding modes according to        type mode selecting commands, perform selection processing on        processed digital data and/or image data output by the        digital/image processor, and output processed digital data        and/or image data required to perform the light-on tests on the        display modules to be tested; and the selection controller is        further connected to the display controller, so that selection        processed digital data and/or image data is output through the        display controller and transmitted through the D-type connectors        to the corresponding display modules to be tested.

In accordance with an embodiment of the present disclosure, theselection controller is further connected to the microprocessor, and isfurther configured to receive type mode selecting commands output by themicroprocessor, to operate, according to the type mode selectingcommands, under corresponding modes.

In accordance with an embodiment of the present disclosure, the displaylight-on test device further includes: a power micro control moduleconnected between the field programmable gate array chip and each of theD-type connectors, and configured to receive power control parametersoutput by the field programmable gate array chip, and output, througheach of the D-type connectors, a corresponding power voltage to each ofthe display modules to be tested according to the power controlparameters, to control the light-on tests to be performed on the displaymodules to be tested at different power.

In accordance with an embodiment of the present disclosure, the fieldprogrammable gate array chip further includes: a power microcontrollerconnected to the parameter configurator and the power micro controlmodule, wherein the control parameters generated by the parameterconfigurator comprise the power control parameters; the powermicrocontroller is configured to receive the power control parameters,generate, according to the power control parameters, corresponding powercontrol commands, and output the corresponding power control commands tothe power micro control module, which controls the corresponding powervoltage to be output.

In order to solve the aforementioned problem, another solution providedby the present disclosure is: providing a display light-on test methodthat uses any of the above display light-on test devices. The methodincludes:

-   -   connecting a display panel to an application processor through        an integrated connector, to form a display module to be tested,        wherein the integrated connector is configured with a test lead        plug and a test lead socket on both sides of the integrated        connector; and the test lead plug and the test lead socket are        both connected to a matching voltage switch, current switch, and        standard current switch;    -   receiving and transmitting power signals through a plurality of        D-type connectors correspondingly connected to the display        modules to be tested;    -   receiving the power signals, sampling and quantizing the power        signals into required digital data and/or image data, and        outputting the digital data and/or image data to a field        programmable gate array chip through a sampling processor;    -   outputting initialization information through a microprocessor        integrated in the field programmable gate array chip; outputting        the initialization information through a display controller        integrated in the field programmable gate array chip;        transmitting the initialization information through the D-type        connectors to the display modules to be tested; and performing        initialization operations on the display modules to be tested;    -   reading stored digital data and/or image data required to        perform light-on tests through a storage controller integrated        in the field programmable gate array chip; and    -   receiving micro control commands sent by the sampling processor,        generating, according to the micro control commands,        corresponding micro control parameters, and processing,        according to the micro control parameters, required digital data        and/or image data through the field programmable gate array        chip; and outputting processed digital data and/or image data        required to perform light-on tests on the display modules to be        tested to the display modules to be tested through the display        controller integrated in the field programmable gate array chip        and connected to the D-type connectors, so that one-time        inspections are performed on the display modules to be tested        and operation of the light-on tests is simultaneously performed        on the display modules to be tested.

In accordance with an embodiment of the present disclosure, only theintegrated connector of the display light-on test device needs to bereplaced for being adapted to a different mobile phone and performing adifferent light-on test.

In accordance with an embodiment of the present disclosure, when aninitial code of a processor interface of the display panel is giventhrough the storage controller integrated in the field programmable gatearray chip, the display panel is lightened directly through the fieldprogrammable gate array chip, without providing power to the displaypanel by the application processor; or when an initial code of aprocessor interface of the display panel is not given, an image is firstcompressed into a standard VESC image receivable by a DIC of the displaypanel, and then the display panel is lightened through the applicationprocessor, a switch of the processor interface is then turned off, andthe compressed image is sent through the field programmable gate arraychip, and a final result is fed back to a display for display.

In accordance with an embodiment of the present disclosure, the methodfurther includes: receiving mobile phone/user commands input by mobilephones/users, and outputting the mobile phone/user commands to thesampling processor.

In accordance with an embodiment of the present disclosure, receivingmicro control commands transmitted by the sampling processor,generating, according to the micro control commands, corresponding microcontrol parameters, and processing, according to the micro controlparameters, required digital data and/or image data through the fieldprogrammable gate array chip; and outputting processed digital dataand/or image data required to perform light-on tests on the displaymodules to be tested to the display modules to be tested through thedisplay controller integrated in the field programmable gate array chipand connected to the D-type connectors includes:

-   -   generating, according to the micro control commands,        corresponding micro control parameters through a parameter        configurator integrated in the field programmable gate array        chip;    -   receiving digital data and/or image data output by the storage        controller, and receiving micro control parameters sent by the        parameter configurator, and processing, according to the micro        control parameters, the digital data and/or image data through a        digital/image processor integrated in the field programmable        gate array chip; and    -   operating under corresponding modes according to type mode        selecting commands, performing selection processing on processed        digital data and/or image data output by the digital/image        processor, and outputting processed digital data and/or image        data required to perform light-on tests on the display modules        to be tested through a selection controller integrated in the        field programmable gate array chip; and outputting, through the        display controller, and transmitting, through the D-type        connectors, selection processed digital data and/or image data        to the corresponding display modules to be tested.

In accordance with an embodiment of the present disclosure, theselection controller receives type mode selecting commands output by themicroprocessor, to operate, according to the type mode selectingcommands, under corresponding modes.

The above solutions of the present disclosure have the followingspecific advantages: {circle around (1)} a display panel is connected toan application processor of a mobile phone through an integratedconnector, to form a display module to be tested, wherein the integratedconnector is configured with a test lead plug (male) and a test leadsocket (female) correspondingly on a left side and a right side of theintegrated connector, and the test lead plug and the test lead socketare both connected to a matching voltage switch, current switch, andstandard current switch; {circle around (2)} with respect to a differenttype of mobile phone, only the integrated connector needs to be replacedfor being adapted to the different type of mobile phone, to form displaymodules to be tested with different connector types; {circle around (3)}a microprocessor, a display controller, and a storage controller areintegrated into a field programmable gate array chip; a plurality ofD-type connectors are correspondingly connected to matching displaymodules to be tested, so that one-time inspections are performed ondifferent types of mobile phones, and operation of light-on tests issimultaneously performed on the different types of mobile phones, ahardware portion of the display light-on test device is simplified, anumber of electronic devices used is reduced, breath of applications andstability of the display light-on test device are enhanced, costs aresaved, and use and subsequent maintenance of the display light-on testdevice by a research and development personnel is facilitated.

DESCRIPTION OF DRAWINGS

In order to describe a technical solution in embodiments or existingtechnology more clearly, drawings required to be used by the embodimentsor the existing technology are briefly introduced below. Obviously, thedrawings in the description below are only some embodiments of thepresent disclosure. With respect to persons of ordinary skill in theart, under a premise that inventive efforts are not made, other drawingsmay be obtained based on these drawings.

FIG. 1 is a schematic structural diagram of a display module to betested of a display light-on test device in accordance with anembodiment of the present disclosure.

FIG. 2 is a schematic overall structural diagram of the display light-ontest device in accordance with an embodiment of the present disclosure.

FIG. 3 is a schematic partial structural diagram of the display light-ontest device in FIG. 2 in accordance with an embodiment of the presentdisclosure.

FIG. 4 is a schematic partial structural diagram of the display light-ontest device in accordance with another embodiment of the presentdisclosure.

FIG. 5 is a flowchart of a display light-on test method in accordancewith an embodiment of the present disclosure.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

Refer to diagrams in the drawings. A same element is labeled by a samereference numeral. Description in conjunction with the drawings below isbased on exemplified specific embodiments of the present disclosure. Itis to be appreciated that the described specific embodiments herein areonly used to illustrate the present disclosure, and should not beconstrued as limiting other specific embodiments of the presentdisclosure not described herein.

Referring to FIG. 1, FIG. 1 is a schematic structural diagram of adisplay module to be tested of a display light-on test device inaccordance with an embodiment of the present disclosure. FIG. 2 is aschematic overall structural diagram of the display light-on test devicein accordance with an embodiment of the present disclosure. FIG. 3 is aschematic partial structural diagram of the display light-on test devicein FIG. 2 in accordance with an embodiment of the present disclosure.

In the present embodiment, the display light-on test device isconfigured to perform one-time inspections on a plurality of displaymodules to be tested, and perform operation of light-on testssimultaneously on the display modules to be tested. The display light-ontest device 1 includes: an integrated connector 10, wherein theintegrated connector 10 is configured with a row of test lead plugs(male) 101 and a row of test lead sockets (female) 102 correspondinglyon a left side and a right side of the integrated connector 10, and eachtest lead plug 101 and each test lead socket 102 are both connected to amatching voltage switch, current switch, and standard current switch.Specifically, for example, each test lead plug 101 on the left side isinstalled with the corresponding voltage switch, current switch, andstandard current switch. Each test lead socket 102 on the right side isinstalled with a corresponding inline voltage meter, inline currentmeter, and current regulator. Therefore, a display panel 70 on the leftside is connected to an application processor 80 of a mobile phone onthe right side, to form a display module to be tested 60.

When a different type of mobile phone has a different kind of connector,refer to FIG. 2. Only the integrated connector 10′ (10″) needs to bereplaced for the display light-on test device 1 to be adapted to thedifferent type of mobile phone. Therefore, a display panel 71 (72) onthe left side is connected to an application processor 81 (82) of amobile phone on the right side, to form another display module to betested 60′ (60″), so that a light-on test may be performed.

Referring to FIGS. 2 and 3, in the present embodiment, the displaylight-on test device 1 further includes: a plurality of D-typeconnectors 11, a sampling processor 12, and a field programmable gatearray chip 13. The field programmable gate array chip 13 is connected tothe D-type connectors 11 and the sampling processor 12. The fieldprogrammable gate array chip 13 includes: a microprocessor 131, adisplay controller 132, and a storage controller 133 storing computingprograms.

Specifically, the D-type connectors 11 are configured to becorrespondingly connected to matching display modules to be tested 60′(60″) among mobile phones with different connector types. Therefore, anumber of the D-type connectors 11 is determined by a plurality ofmobile phones connected. Referring to FIG. 2, in the present embodiment,3 simultaneously connected mobile phones with different connector typesare illustrated as an example. The 3 D-type connectors 11 are allcorrespondingly connected to the matching display modules to be tested60, 60′, 60″. The D-type connectors 11 receive and transmit a processorinterface power signal, a positive voltage power signal, a negativevoltage power signal, a TIC power signal, etc. The sampling processor 12is configured to receive mobile phone (or user) commands and output,according to the mobile phone (or user) commands, corresponding microcontrol commands, sample and quantize a received DIC power signal, TICpower signal, positive voltage power signal, negative voltage powersignal, etc., into required signal data (including digital data and/orimage data), and output the signal data to the field programmable gatearray chip 13. The field programmable gate array chip 13 is connected tothe D-type connectors and the sampling processor 12 to receive thesignal data and generate, according to the micro control commands,corresponding micro control parameters, and process the signal dataaccording to the micro control parameters, to output signal datarequired to perform the light-on tests to the display modules to betested 60, 60′, 60″, so that the light-on tests are performed on thedisplay modules to be tested 60, 60′, 60″.

Specifically, the field programmable gate array chip 13 has themicroprocessor 131, the display controller 132, and the storagecontroller 133 storing computing programs integrated therein. Themicroprocessor 131 is connected to the display controller 132, and thedisplay controller 132 is connected to the display modules to be tested60, 60′, 60″ through the D-type connectors 11. The storage controller133 is connected to the D-type connectors 11 and the sampling processor,and reads digital signal data and/or image signal data storedinternally, and then provides the digital signal data and/or imagesignal data suitably to the microprocessor 131.

Specifically, the microprocessor 131 integrated within the fieldprogrammable gate array chip 13 is configured to output initializationinformation. The display controller 132 is configured to output theinitialization information to each display module to be tested 60 (60′,60″) for an initialization operation to be performed on each displaymodule to be tested 60 (60′, 60″). The field programmable gate arraychip 13 is integrated with the storage controller 133 internallyconfigured with the stored computing programs, and connected to theD-type connectors 11 and the sampling processor 12 to receive and storedigital data and/or image data required to perform the light-on testsand the micro control commands sent by the D-type connectors 11, and thesampling processor 12, and read and perform analysis and categorizationon internally stored digital data and/or image data. The fieldprogrammable gate array chip 13 generates, according to the microcontrol commands, the corresponding micro control parameters, processes,according to the micro control parameters, digital data and/or imagedata, to output processed digital data and/or image data required toperform light-on tests on the display modules to be tested. Theprocessed digital data and/or image data is suitably provided to themicroprocessor 131, and transmitted to the display modules to be tested60, 60′, 60″ through the display controller 132 connected to the D-typeconnectors 11, so that the one-time inspections are performed on thedisplay modules to be tested 60, 60′, 60″, and the operation of thelight-on tests is simultaneously performed on the display modules to betested 60, 60′, 60″.

Specifically, the sampling processor 12 further includes: adigital-to-analog converter 121 configured to sample and quantizevoltage and current signals, and power consumption received by thesampling processor 12 into required digital signals, and output thedigital signals to the field programmable gate array chip 13, so thatthe field programmable gate array chip 13 performs the light-on tests,thereby realizing automatic test operation.

In the present embodiment, a display panel is connected to anapplication processor of a mobile phone through an integrated connector,to form a display module to be tested; with respect to a different typeof mobile phone, only the integrated connector needs to be replaced forbeing adapted to the different type of mobile phone, to form displaymodules to be tested with different connector types; a microprocessor, adisplay controller, and a storage controller are integrated into a fieldprogrammable gate array chip; and a plurality of D-type connectors arecorrespondingly connected to matching display modules to be tested, sothat one-time inspections are performed on different types of mobilephones, and operation of light-on tests is simultaneously performed onthe different types of mobile phones, a hardware portion of the displaylight-on test device is simplified, a number of electronic devices usedis reduced, breath of applications and stability of the display light-ontest device are enhanced, costs are saved, and use and subsequentmaintenance of the display light-on test device by a research anddevelopment personnel is facilitated.

When an initial code of a DIC processor interface of a display panel isgiven through the storage controller integrated in the fieldprogrammable gate array chip, the display panel is lightened directlythrough the field programmable gate array chip, without providing powerto the display panel by the application processor, but providing powerto the display panel by the field programmable gate array chip; or whenan initial code of a DIC processor interface of a display panel is notgiven, an image is first compressed into a standard VESC imagereceivable by a DIC, and then the display panel is lightened through theapplication processor, a switch of the processor interface is thenturned off, and the compressed image is sent through the fieldprogrammable gate array chip, and a final result is fed back to adisplay for display. The field programmable gate array chip can furtherbe combined with an optical algorithm, to analyze optical issues.

Referring to FIGS. 2 and 4, FIG. 4 is a schematic partial structuraldiagram of the display light-on test device in accordance with anotherembodiment of the present disclosure. Compared to the above embodiment,the display light-on test device 2 in the present embodiment includes:an integrated connector 10, D-type connectors 21, a sampling processor22, a field programmable gate array chip 23, a mobile phone/user commandreceiving module 24, and a power micro control module 25. The fieldprogrammable gate array chip 23 is connected to the D-type connectors 21and the sampling processor 22. The field programmable gate array chip 23includes a microprocessor 231, a display controller 232, a storagecontroller 233, a digital/image processor 234, a selection controller235, a parameter configurator 236, and a power microcontroller 237.

Specifically, the sampling processor 22 further includes: adigital-to-analog converter 221 configured to sample and quantizevoltage and current signals, and power consumption received by thesampling processor 22 into required digital signals, and output thedigital signals to the field programmable gate array chip 23, so thatthe field programmable gate array chip 23 performs the light-on tests,thereby realizing automatic test operation.

Specifically, the microprocessor 231 is connected to the displaycontroller 232, and the display controller 232 is connected to thedisplay modules to be tested 60, 60′, 60″ through the D-type connectors21. The storage controller 233 stores computing programs therein, and isconnected to the D-type connectors 21 and the sampling processor 22. Thestorage controller 233 reads digital signal data and/or image signaldata stored internally, and then provides the digital signal data and/orimage signal data suitably to the microprocessor 131. The microprocessor231 is further connected to the selection controller 235. The mobilephone/user command receiving module 24 is connected to the samplingprocessor 22.

The storage controller 233 is further connected to the digital/imageprocessor 234 and the parameter configurator 236. The digital/imageprocessor 234 is further connected to the selection controller 235 andthe parameter configurator 236. The selection controller 235 is furtherconnected to the display controller 232.

The parameter configurator 236 is further connected to the powermicrocontroller 237. The power microcontroller 237 is connected to thepower micro control module 25.

Specifically, the storage controller 233 is connected to the D-typeconnectors 21 and the sampling processor 22 to receive and store digitaldata and/or image data required to perform the light-on tests and microcontrol commands sent by the D-type connectors 21, and the samplingprocessor 22, and read and perform analysis and categorization oninternally stored digital data and/or image data. The parameterconfigurator 236 receives micro control commands output by the storagecontroller 233, and generates, according to the micro control commands,corresponding micro control parameters. The digital/image processor 234is configured to receive digital data and/or image data output by thestorage controller 233, and the digital/image processor 234 is furtherconfigured to process, according to control parameters output by theparameter configurator 236, the digital data and/or image data. Theselection controller 235 is configured to receive type mode selectingcommands output by the microprocessor 231 (i.e. display modules to betested with different connector types received by the D-type connectors21), operate under corresponding modes according to the type modeselecting commands, perform selection processing on processed digitaldata and/or image data output by the digital/image processor, and outputprocessed digital data and/or image data required to perform thelight-on tests on the display modules to be tested. The selectioncontroller 235 transmits, through the display controller 132 connectedto the D-type connectors 11, matching digital data and/or image data todisplay modules to be tested 60, 60′, 60″, so that one-time inspectionsare performed on the display modules to be tested 60, 60′, 60″, andoperation of the light-on tests is simultaneously performed on thedisplay modules to be tested 60, 60′, 60″.

Specifically, the sampling processor 22 is configured to receive modecommands output by the mobile phone/user command receiving module 24,analyze the mode commands to generate the micro control commands, andsend control commands obtained from analysis to the parameterconfigurator 236 throughout storage controller 233. The parameterconfigurator 236 generates the corresponding control parameters. Thedigital/image processor 234 is further configured to process, accordingto the control parameters output by the parameter configurator 236, thedigital data and/or image data. The selection controller 235 isconfigured to output, according to type mode selecting commands outputby the microprocessor 231, corresponding parameters for selectingcorresponding processed digital data and/or image data to thedigital/image processor 234, and corresponding power control parametersto the power microcontroller 237. The power microcontroller 237 receivesthe power control parameters output by the selection controller 235, andgenerates, according to the power control parameters, correspondingpower control commands, and outputs the corresponding power controlcommands to the power micro control module 25, which controlscorresponding power voltage to be output by the power micro controlmodule 25.

The power micro control module 25 is configured to receive power controlparameters output by the field programmable gate array chip 23, andoutput through each of the D-type connectors, the corresponding powervoltage to each of the display modules to be tested 60, 60′, 60″, tocontrol the light-on tests to be performed on the display modules to betested 60, 60′, 60″ at different power.

In the present embodiment, a display is connected to an applicationprocessor of a mobile phone through an integrated connector, to form adisplay module to be tested; with respect to a different type of mobilephone, only the integrated connector needs to be replaced for beingadapted to the different type of mobile phone, to form display modulesto be tested with different connector types; a microprocessor, a displaycontroller, and a storage controller are integrated into a fieldprogrammable gate array chip; and a plurality of D-type connectors arecorrespondingly connected to matching display modules to be tested, sothat one-time inspections are performed on different types of mobilephones, and operation of light-on tests is simultaneously performed onthe different types of mobile phones, a hardware portion of the displaylight-on test device is simplified, a number of electronic devices usedis reduced, breath of applications and stability of the display light-ontest device are enhanced, costs are saved, and use and subsequentmaintenance of the display light-on test device by a research anddevelopment personnel is facilitated.

When an initial code of a DIC processor interface of a display panel isgiven through the storage controller integrated in the fieldprogrammable gate array chip, the display panel is lightened directlythrough the field programmable gate array chip, without providing powerto the display panel by the application processor, but providing powerto the display panel by the field programmable gate array chip; or whenan initial code of a DIC processor interface of a display panel is notgiven, an image is first compressed into a standard VESC imagereceivable by a DIC, and then the display panel is lightened through theapplication processor, a switch of the processor interface is thenturned off, and the compressed image is sent through the fieldprogrammable gate array chip, and a final result is fed back to adisplay for display. The field programmable gate array chip can furtherbe combined with an optical algorithm, to analyze optical issues.

Referring to FIG. 5, FIG. 5 is a flowchart of a display light-on testmethod in accordance with an embodiment of the present disclosure. Thedisplay light-on test method of the present disclosure uses any of theabove display light-on test devices. As illustrated in FIG. 5, themethod includes:

S501: connecting a display panel to an application processor of a mobilephone through an integrated connector, to form a display module to betested, wherein the integrated connector is configured with a test leadplug and a test lead socket correspondingly on a left side and a rightside of the integrated connector, and the test lead plug and the testlead socket are both connected to a matching voltage switch, currentswitch, and standard current switch;

S502: receiving and transmitting power signals through a plurality ofD-type connectors correspondingly connected to display modules to betested among mobile phones with different connector types;

S503: receiving the power signals, sampling and quantizing the powersignals into required digital data and/or image data, and outputting thedigital data and/or image data to a field programmable gate array chipthrough a sampling processor;

S504: outputting initialization information through a microprocessorintegrated in the field programmable gate array chip; outputtinginitialization information through a microprocessor integrated in thefield programmable gate array chip; outputting the initializationinformation through a display controller integrated in the fieldprogrammable gate array chip; transmitting the initializationinformation through the D-type connectors to the display modules to betested; and performing initialization operations on the display modulesto be tested;

S505: reading stored digital data and/or image data required to performlight-on tests through a storage controller integrated in the fieldprogrammable gate array chip;

S506: receiving micro control commands sent by the sampling processor,generating, according to the micro control commands, corresponding microcontrol parameters, and processing, according to the micro controlparameters, required digital data and/or image data through the fieldprogrammable gate array chip; and outputting processed digital dataand/or image data required to perform light-on tests on the displaymodules to be tested to the display modules to be tested through thedisplay controller integrated in the field programmable gate array chipand connected to the D-type connectors, so that one-time inspections areperformed on the display modules to be tested and operation of thelight-on tests is simultaneously performed on the display modules to betested.

A detailed test process has been provided in the embodiments above andis omitted here.

In the present embodiment, a display is connected to an applicationprocessor of a mobile phone through an integrated connector, to form adisplay module to be tested; with respect to a different type of mobilephone, only the integrated connector needs to be replaced for beingadapted to the different type of mobile phone, to form display modulesto be tested with different connector types; a microprocessor, a displaycontroller, and a storage controller are integrated into a fieldprogrammable gate array chip; and a plurality of D-type connectors arecorrespondingly connected to matching display modules to be tested, sothat one-time inspections are performed on different types of mobilephones, and operation of light-on tests is simultaneously performed onthe different types of mobile phones, a hardware portion of the displaylight-on test device is simplified, a number of electronic devices usedis reduced, breath of applications and stability of the display light-ontest device are enhanced, costs are saved, and use and subsequentmaintenance of the display light-on test device by a research anddevelopment personnel is facilitated.

When an initial code of a DIC processor interface of a display panel isgiven through the storage controller integrated in the fieldprogrammable gate array chip, the display panel is lightened directlythrough the field programmable gate array chip, without providing powerto the display panel by the application processor, but providing powerto the display panel by the field programmable gate array chip; or whenan initial code of a DIC processor interface of a display panel is notgiven, an image is first compressed into a standard VESC imagereceivable by a DIC, and then the display panel is lightened through theapplication processor, a switch of the processor interface is thenturned off, and the compressed image is sent through the fieldprogrammable gate array chip, and a final result is fed back to adisplay for display. The field programmable gate array chip can furtherbe combined with an optical algorithm, to analyze optical issues.

In summary, although the present disclosure has been described withpreferred embodiments thereof above, it is not intended to be limited bythe foregoing preferred embodiments. Persons skilled in the art cancarry out many changes and modifications to the described embodimentswithout departing from the scope and the spirit of the presentdisclosure. An equivalent structure or an equivalent process obtainedusing the content of the specification and the drawings of the presentdisclosure, or an embodiment obtained by directly or indirectly applyingthe content of the specification and the drawings of the presentdisclosure to another related technical field should be equally includedin the patent protection scope of the present disclosure.

What is claimed is:
 1. A display light-on test device, configured toperform light-on tests on a plurality of display modules to be testedsimultaneously, and comprising: a plurality of integrated connectors,wherein each of the integrated connectors is configured with acorresponding test lead plug and a corresponding test lead socket onboth sides of each of the integrated connectors; and the correspondingtest lead plug and the corresponding test lead socket are both connectedto a matching voltage switch, current switch, and standard currentswitch, so that the integrated connectors connect display panels of acorresponding plurality of mobile phones with different connector typesto application processors thereof, to form the display modules to betested; a plurality of D-type connectors correspondingly connected tothe display modules to be tested, and configured to receive and transmitpower signals; a sampling processor configured to receive the powersignals, sample and quantize the power signals into required digitaldata and/or image data, and output the digital data and/or image data toa field programmable gate array chip, receive commands, and output,according to the commands, corresponding micro control commands; and thefield programmable gate array chip having a microprocessor, a displaycontroller, and a storage controller integrated therein, wherein themicroprocessor is configured to output initialization information, andis connected to the display controller; the field programmable gatearray chip outputs, through the display controller, the initializationinformation which is transmitted to the display modules to be testedthrough the D-type connectors, for initialization operations to beperformed; the storage controller is connected to the D-type connectorsand the sampling processor, and configured to receive the digital dataand/or image data and the micro control commands; the field programmablegate array chip generates, according to the micro control commands,corresponding micro control parameters, and processes, according to themicro control parameters, the digital data and/or image data, to outputdigital data and/or image data required to perform the light-on tests onthe display modules to be tested to the display modules to be tested, sothat operation of the light-on tests is performed on the display modulesto be tested simultaneously.
 2. The display light-on test device ofclaim 1, wherein the sampling processor comprises: a digital-to-analogconverter configured to sample and quantize voltage and current signals,and power consumption received by the sampling processor into requireddigital signals, and output the digital signals to the fieldprogrammable gate array chip, so that the field programmable gate arraychip performs the light-on tests.
 3. The display light-on test device ofclaim 1, wherein the sampling processor is further connected to a mobilephone/user command receiving module configured to receive mobilephone/user commands input by mobile phones/users, and output the mobilephone/user commands to the sampling processor.
 4. The display light-ontest device of claim 1, wherein the field programmable gate array chipfurther comprises: a parameter configurator connected to the storagecontroller, and configured to generate, according to the micro controlcommands, the corresponding micro control parameters; a digital/imageprocessor connected to the storage controller and the parameterconfigurator, and configured to receive digital data and/or image dataoutput by the storage controller, and receive micro control parameterssent by the parameter configurator, and process, according to the microcontrol parameters, the digital data and/or image data; and a selectioncontroller connected to the digital/image processor, and configured tooperate under corresponding modes according to type mode selectingcommands, perform selection processing on processed digital data and/orimage data output by the digital/image processor, and output processeddigital data and/or image data required to perform light-on tests on thedisplay modules to be tested; and the selection controller is furtherconnected to the display controller, so that selection processed digitaldata and/or image data is output through the display controller andtransmitted through the D-type connectors to the corresponding displaymodules to be tested.
 5. The display light-on test device of claim 4,wherein the selection controller is further connected to themicroprocessor, and is further configured to receive type mode selectingcommands output by the microprocessor, to operate, according to the typemode selecting commands, under corresponding modes.
 6. The displaylight-on test device of claim 5, wherein the display light-on testdevice further comprises: a power micro control module connected betweenthe field programmable gate array chip and each of the D-typeconnectors, and configured to receive power control parameters output bythe field programmable gate array chip, and output, through each of theD-type connectors, a corresponding power voltage to each of the displaymodules to be tested according to the power control parameters, tocontrol the light-on tests to be performed on the display modules to betested at different power.
 7. The display light-on test device of claim6, wherein the field programmable gate array chip further comprises: apower microcontroller connected to the parameter configurator and thepower micro control module, wherein the control parameters generated bythe parameter configurator comprise the power control parameters; thepower microcontroller is configured to receive the power controlparameters, generate, according to the power control parameters,corresponding power control commands, and output the corresponding powercontrol commands to the power micro control module, which controls thecorresponding power voltage to be output.
 8. A display light-on testdevice, configured to perform light-on tests on a plurality of displaymodules to be tested simultaneously, and comprising: an integratedconnector, wherein the integrated connector is configured with a testlead plug and a test lead socket on both sides of the integratedconnector; and the test lead plug and the test lead socket are bothconnected to a matching voltage switch, current switch, and standardcurrent switch, so that the integrated connector connects a displaypanel to an application processor, to form a display module to betested; a plurality of D-type connectors correspondingly connected tothe display modules to be tested, and configured to receive and transmitpower signals; a sampling processor configured to receive the powersignals, sample and quantize the power signals into required digitaldata and/or image data, and output the digital data and/or image data toa field programmable gate array chip, receive commands, and output,according to the commands, corresponding micro control commands; and thefield programmable gate array chip having a microprocessor, a displaycontroller, and a storage controller integrated therein, wherein themicroprocessor is configured to output initialization information, andis connected to the display controller; the field programmable gatearray chip outputs, through the display controller, the initializationinformation which is transmitted to the display modules to be testedthrough the D-type connectors, for initialization operations to beperformed; the storage controller is connected to the D-type connectorsand the sampling processor, and configured to receive the digital dataand/or image data and the micro control commands; the field programmablegate array chip generates, according to the micro control commands,corresponding micro control parameters, and processes, according to themicro control parameters, the digital data and/or image data, to outputdigital data and/or image data required to perform the light-on tests onthe display modules to be tested to the display modules to be tested, sothat operation of the light-on tests is performed on the display modulesto be tested simultaneously.
 9. The display light-on test device ofclaim 8, wherein the sampling processor comprises: a digital-to-analogconverter configured to sample and quantize voltage and current signals,and power consumption received by the sampling processor into requireddigital signals, and output the digital signals to the fieldprogrammable gate array chip, so that the field programmable gate arraychip performs the light-on tests.
 10. The display light-on test deviceof claim 8, wherein the sampling processor is further connected to amobile phone/user command receiving module configured to receive mobilephone/user commands input by mobile phones/users, and output the mobilephone/user commands to the sampling processor.
 11. The display light-ontest device of claim 8, wherein the field programmable gate array chipfurther comprises: a parameter configurator connected to the storagecontroller, and configured to generate, according to the micro controlcommands, the corresponding micro control parameters; a digital/imageprocessor connected to the storage controller and the parameterconfigurator, and configured to receive digital data and/or image dataoutput by the storage controller, and receive micro control parameterssent by the parameter configurator, and process, according to the microcontrol parameters, the digital data and/or image data; and a selectioncontroller connected to the digital/image processor, and configured tooperate under corresponding modes according to type mode selectingcommands, perform selection processing on processed digital data and/orimage data output by the digital/image processor, and output processeddigital data and/or image data required to perform the light-on tests onthe display modules to be tested; and the selection controller isfurther connected to the display controller, so that selection processeddigital data and/or image data is output through the display controllerand transmitted through the D-type connectors to the correspondingdisplay modules to be tested.
 12. The display light-on test device ofclaim 11, wherein the selection controller is further connected to themicroprocessor, and is further configured to receive type mode selectingcommands output by the microprocessor, to operate, according to the typemode selecting commands, under the corresponding modes.
 13. The displaylight-on test device of claim 12, wherein the display light-on testdevice further comprises: a power micro control module connected betweenthe field programmable gate array chip and each of the D-typeconnectors, and configured to receive power control parameters output bythe field programmable gate array chip, and output, through each of theD-type connectors, a corresponding power voltage to each of the displaymodules to be tested according to the power control parameters, tocontrol the light-on tests to be performed on the display modules to betested at different power.
 14. The display light-on test device of claim13, wherein the field programmable gate array chip further comprises: apower microcontroller connected to the parameter configurator and thepower micro control module, wherein the control parameters generated bythe parameter configurator comprise the power control parameters; thepower microcontroller is configured to receive the power controlparameters, generate, according to the power control parameters,corresponding power control commands, and output the corresponding powercontrol commands to the power micro control module, which controls thecorresponding power voltage to be output.
 15. A display light-on testmethod that uses a display light-on test device of claim 8, comprising:connecting a display panel to an application processor through anintegrated connector, to form a display module to be tested, wherein theintegrated connector is configured with a test lead plug and a test leadsocket on both sides of the integrated connector; and the test lead plugand the test lead socket are both connected to a matching voltageswitch, current switch, and standard current switch; receiving andtransmitting power signals through a plurality of D-type connectorscorrespondingly connected to display modules to be tested; receiving thepower signals, sampling and quantizing the power signals into requireddigital data and/or image data, and outputting the digital data and/orimage data to a field programmable gate array chip through a samplingprocessor; outputting initialization information through amicroprocessor integrated in the field programmable gate array chip;outputting the initialization information through a display controllerintegrated in the field programmable gate array chip; transmitting theinitialization information through the D-type connectors to the displaymodules to be tested; and performing initialization operations on thedisplay modules to be tested; reading stored digital data and/or imagedata required to perform light-on tests through a storage controllerintegrated in the field programmable gate array chip; and receivingmicro control commands sent by the sampling processor, generating,according to the micro control commands, corresponding micro controlparameters, and processing, according to the micro control parameters,required digital data and/or image data through the field programmablegate array chip; and outputting processed digital data and/or image datarequired to perform light-on tests on the display modules to be testedto the display modules to be tested through the display controllerintegrated in the field programmable gate array chip and connected tothe D-type connectors, so that one-time inspections are performed on thedisplay modules to be tested and operation of the light-on tests issimultaneously performed on the display modules to be tested.
 16. Thedisplay light-on test method of claim 15, wherein only the integratedconnector of the display light-on test device needs to be replaced forbeing adapted to a different mobile phone and performing a differentlight-on test.
 17. The display light-on test method of claim 15, whereinwhen an initial code of a processor interface of the display panel isgiven through the storage controller integrated in the fieldprogrammable gate array chip, the display panel is lightened directlythrough the field programmable gate array chip, without providing powerto the display panel by the application processor; or when an initialcode of a processor interface of the display panel is not given, animage is first compressed into a standard VESC image receivable by a DICof the display panel, and then the display panel is lightened throughthe application processor, a switch of the processor interface is thenturned off, and the compressed image is sent through the fieldprogrammable gate array chip, and a final result is fed back to adisplay for display.
 18. The display light-on test method of claim 15,further comprising: receiving mobile phone/user commands input by mobilephones/users, and outputting the mobile phone/user commands to thesampling processor.
 19. The display light-on test method of claim 15,wherein receiving micro control commands transmitted by the samplingprocessor, generating, according to the micro control commands,corresponding micro control parameters, and processing, according to themicro control parameters, required digital data and/or image datathrough the field programmable gate array chip; and outputting processeddigital data and/or image data required to perform light-on tests on thedisplay modules to be tested to the display modules to be tested throughthe display controller integrated in the field programmable gate arraychip and connected to the D-type connectors comprises: generating,according to the micro control commands, corresponding micro controlparameters through a parameter configurator integrated in the fieldprogrammable gate array chip; receiving digital data and/or image dataoutput by the storage controller, and receiving micro control parameterssent by the parameter configurator, and processing, according to themicro control parameters, the digital data and/or image data through adigital/image processor integrated in the field programmable gate arraychip; and operating under corresponding modes according to type modeselecting commands, performing selection processing on processed digitaldata and/or image data output by the digital/image processor, andoutputting processed digital data and/or image data required to performlight-on tests on the display modules to be tested through a selectioncontroller integrated in the field programmable gate array chip; andoutputting, through the display controller, and transmitting, throughthe D-type connectors, selection processed digital data and/or imagedata to the corresponding display modules to be tested.
 20. The displaylight-on test method of claim 19, wherein the selection controllerreceives type mode selecting commands output by the microprocessor, tooperate, according to the type mode selecting commands, undercorresponding modes.